Equipment Listings - Testing Equipment

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• Resistivity Gauges
  • IEC# 117779 - ADE 6035 Resistivity Gauges (6035) - MicroSense 6035 ADE’s Model 6035 uses non-contact eddy-current probes to accurately measure Bulk Resistivity of wafers. This MicroSense system handles wafers up to 150mm in diameter, and is useful in the...
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• Test Systems
  • IEC# 117782 - Teradyne Model J-971SP Digital Test System. Designed with 64 I/O Channels on the standard system. Channels can be added in increments of 32 up to a maximum of 512. Pattern Depth (This is LVM) 8 Meg. Edge Sets 64; Edge Accuracy 225 ps; Voltage...
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• Thickness Gauges
  • IEC# 117780 - ADE 6033 Thickness Gauges (6033T) - MicroSense 6033T The Model 6033T, using ADE’s patented capacitive measurement principle, measures wafers for Thickness and Total Thickness Variation (TVV). Whenever semiconductor wafer inspection is required, the...
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