IEC Number
Description
Category
Pharmaceuticals Plant Equipment also available at:
Home
Used Equipment Categories
Industrial Sites
Sell Equipment
About Us
Login
Register
Equipment Listings
Testing Equipment
Wafer Fabrication Equipment
Wafer Metrology Equipment
NEW EQUIPMENT
Advertise or Browse Semiconductor Equipment Categories
Useful Links
Semiconductor Service and Packaging Companies
Semiconductor Raw Material and Feedstock Companies
Semiconductor Equipment Vendors
Semiconductor Design and Technical Consultants
Machine Listing - Test Systems
IEC
117782
Year (Age)
1998
Type
Digital
Manufacturer
Teradyne
Quantity
One (1)
Model
J-971SP
Equipment Class
Test Equipment
Please Contact Us for More Information
Description:
Teradyne Model J-971SP Digital Test System. Designed with 64 I/O Channels on the standard system. Channels can be added in increments of 32 up to a maximum of 512. Pattern Depth (This is LVM) 8 Meg. Edge Sets 64; Edge Accuracy 225 ps; Voltage Sources 8; MTO Yes; CTO No LVM 8 Meg (Same as pattern depth above); VMO 1Meg VMO on all channels; Enhanced waveview Yes. Manufactured in 1998.