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Machine Listing - Thickness Gauges

IEN 117780
Type Lab Equipment
Wafer Size 150 mm
Model 6033
Manufacturer ADE
Equipment Class Test Equipment

  ADE 6033 Thickness Gauges (6033T) - MicroSense 6033T The Model 6033T, using ADE’s patented capacitive measurement principle, measures wafers for Thickness and Total Thickness Variation (TVV). Whenever semiconductor wafer inspection is required, the MicroSense Model 6033T offers a low cost method of achieving fast, accurate measurements on wafers up to 150mm in diameter. Features Non-contact Low cost All-electronic gaging, Fast set-up, Easy operation, Thickness TTV