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Machine Listing - Thickness Gauges
IEN
117780
Type
Lab Equipment
Wafer Size
150 mm
Model
6033
Manufacturer
ADE
Equipment Class
Test Equipment
Please Contact Us for More Information
Description:
ADE 6033 Thickness Gauges (6033T) - MicroSense 6033T The Model 6033T, using ADE’s patented capacitive measurement principle, measures wafers for Thickness and Total Thickness Variation (TVV). Whenever semiconductor wafer inspection is required, the MicroSense Model 6033T offers a low cost method of achieving fast, accurate measurements on wafers up to 150mm in diameter. Features Non-contact Low cost All-electronic gaging, Fast set-up, Easy operation, Thickness TTV